High performance analytical instrumentation for the characterisation of the chemical, electronic and physical properties of existing and new materials.
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Ultra Fast Elemental Depth Profiling
The GD-Profiler 2™ provides fast, simultaneous analysis of all elements of interest including the gases nitrogen, oxygen, hydrogen and chlorine. It is an ideal tool for thin film characterization and process studies.
HORIBA Scientific Pulsed RF Glow Discharge Spectrometers are used in academia and industry alike, from the development of new materials with ano-scale coatings to photovoltaic device manufacturing, helping to understand the origin of corrosion on painted car bodies, the composition of precious metals, to hard disks, LED manufacturing, or to improve Li batteries, etc.
Cross collaboration with the advanced plasma coating research community has helped to drastically improve the instrumentation in the last 15 years, ISO standards have been published and the technique is now well established for material characterisation.
The XGT X-ray Fluorescence micro-analyzers combine the fast, non-destructive elemental analysis of energy dispersive X-ray Fluorescence (EDXRF) with the capability to pinpoint individual particles with diameters down to 10 µm in size. Automated sample scanning provides detailed images of element distribution, over areas as large as 10cm x 10cm.
There is no sample preparation or vacuum required – the object is simply placed in the sample chamber and analysed at normal atmospheric pressure. Fully integrated software controls sample movement, acquisition options and data analysis (including qualitative and quantitative analysis, and composite image generation). From when a sample is put in the chamber, just a few seconds are needed until an acquisition is started, aided by intuitive “point and click” selection of the analysis position.
The sample is visualised with coaxial geometry, so that parallax errors are removed. You have absolute confidence that where you see is where you sample.
Two X-ray guide tubes are provided in the instrument, allowing the user to simply switch between a micro and macro beams, so that a range of experiments can be accommodated. The high intensity beam delivered by these guide tubes ensures that acquisition times are kept to a minimum. The mono-capillary design of these guide tubes are ideally suited for high intensity element imaging, even of samples which are not perfectly flat.
XRF mapped images are easily obtained through automated sample scanning, and the provision of a second detector beneath the sample enables simultaneous acquisition of X-ray transmission images. The additional structural information provided by this technology is extremely useful for locating regions of interest, or interrogating a sample’s internal structure.
Plasma profiling Time of flight mass spectrometry
HORIBA Scientific’s novel Plasma Profiling TOFMS (PP-TOFMS) instrument provides the chemical composition as a function of depth of solid materials. This depth profiling technique consists of a glow discharge plasma source that erodes and ionizes sample material coupled to an ultra fast time of flight mass spectrometer.
The high ionic density of the glow discharge plasma results in a high sputtering rate. In addition the pre-analysis time is very much reduced as samples do not need to be transferred to a high vacuum chamber. As a result, sub-micron thin films can be analysed in a few minutes.
The use of a radio frequency excitation signal allows analysis of all types of materials ranging from conductive to non-conductive (e.g. thin films on thick glass substrates) and from inorganic to hybrid. A quick sample preparation permits the analysis of coatings on flexible substrates.
The great advantage of a time of flight mass analyser is its capability of recording complete and continuous mass spectra. PP-TOFMS measures a mass spectrum covering all elements of the periodic table every 33 µs. Any element can thus be monitored as a function of erosion time/depth. This means not only zero risk for missing any elemental depth variation but also full probability of detecting the presence of unexpected elements (contamination). Finally all isotopes are recorded, which can be useful in case of isobaric interferences and for studying mechanisms (oxidation, diffusion) through the use of isotopic labelling.
CLUE Series – Cathodoluminescence solutions for electron microscopy
HORIBA Scientific’s Cathodoluminescence Universal Extension (CLUE) enhances any SEM’s analytical capabilities while maintaining its original functionality. Since the sample is able to remain in the same spot, CLUE can easily be combined with other microscopy applications, such as EDS and EBIC.
CLUE systems provide high resolution spectral information with the spatial resolution of an electron probe. We feature the widest spectral range available (UV-VIS to IR), fast CL imaging, CL spectroscopy for detecting trace elements in natural and synthetic minerals, and hyperspectral mapping.
Cathodoluminescence (CL) is an essential non-destructive analytical technique useful in a wide range of applications including semiconductors, optoelectronics, dielectrics and ceramics. CL is also a powerful tool for investigations in geology, mineralogy, forensics, and life sciences.
Photoluminescence (or PL) is a spectroscopy technique providing information on electrical and optical properties of semiconductor materials, such as bandgap, emission wavelength, crystallinity and crystal structure, defects etc…
A PL Mapper is a laser based instrument used to generate maps of several parameters over full wafers by measuring optical luminescence emission from materials excited with energy above their bandgap.
HORIBA Scientific micro-PL mapping systems are used to image small features made out of those semiconducting materials, such as diodes or nano structures like Gallium Nitride (GaN) or Silicon (Si) nanowires, Carbon Nanotubes etc…
Since the Photoluminescence Microscope systems are based on HORIBA Scientific leading Raman spectrometer systems, Raman studies can also be conducted on the same instrument.
Photoluminescence Mapping systems from HORIBA Scientific are used for research or production environments, and can be fitted with temperature controlled cells (LN2 or He cryostats) to measure photoluminescence emission at low temperature. This technique usually helps getting clearer information, from sharper spectral features.
We can work with you to help get the ideal instruments into your university by providing any information you require.