3D surface metrology describes the measurement and characterisation of micro- and nano-scale featuers on natural or manufactured surfaces. Sensofar Metrology provides high end non-contact 3D surface profilers based on complementary confocal, interferometry and focus variation techniques (thus ‘3-in-1’). As a result, the systems provide unrivalled versatility for optical measurements of structure and texture across varying surface scales, and even deliver areal surface roughness to ISO 25178 standards. From complete set-ups for industry, R&D and standards laboratories, to flexible and fast in-line metrology solutions with small footprint for production processes.
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